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Count IJ 220
Paper Level SCIE
IEEE Format H.-Y. Kim, S. Park, Y.-G. Shin, S.-W. Jung, and S.-J. Ko, "Detail Restoration and Tone Mapping Networks for X-Ray Security Inspection," IEEE Access, vol. 8, pp.197473-197483, Nov. 2020.
H.-Y. Kim, S. Park, Y.-G. Shin, S.-W. Jung, and S.-...
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Count IJ221
Paper Level SCIE
IEEE Format M. Fan, S.-W Kim, S.-T. Kim, J.-Y. Sun, and S.-J. Ko, "Simple But Effective Scale Estimation for Monocular Visual Odometry in Road Driving Scenarios," IEEE ACCESS, vol. 8, pp. 175891--175903, Sep, 2020
M. Fan, S.-W Kim, S.-T. Kim, J.-Y. Sun, and S.-J. K...
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Count IJ228
Paper Level SCIE
IEEE Format H.-Y. Kim, S.-J. Cho, S.-J. Baek, S.-W. Jung, and S.-J. Ko, "Learning-based Image Synthesis for Hazardous Object Detection in X-ray Security Applications," IEEE Access, vol. 9, pp. 135256-135265, Oct. 2021.
Hyo-Young Kim, Sung-Jin Cho, Seung-Jin Baek, Seung-...
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Count IJ229
Paper Level SCIE
IEEE Format K. -H. Uhm, K. Choi, S. -W. Jung and S. -J. Ko, "Image Compression-Aware Deep Camera ISP Network," in IEEE Access, vol. 9, pp. 137824-137832, 2021
K. -H. Uhm, K. Choi, S. -W. Jung and S. -J. Ko, "Im...
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Count IC0006
Paper Level SCIE,None
IEEE Format S.-J. Ko, T.M. Forest , and F. Kimura, "Image Restoration Algorithms using Modified Quadratic Discriminant Functions," Proc. of 28th Annual Allerton Conf., pp. 599-560, Oct. 1990.
vol, no, page, urls, o | p, paper file, program file
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Count IJ216
Paper Level SCI,SCIE
IEEE Format Y.-G. Shin, M.-C. Sagong, Y.-J. Yeo, S.-W. Kim, and S.-J. Ko, "PEPSI++: Fast and Lightweight Network for Image Inpainting," IEEE transactions on Neural Networks and Learning Systems, pp.1-14, Mar. 2020.
Y.-G. Shin, M.-C. Sagong, Y.-J. Yeo, S.-W. Kim, and...
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Count IJ217
Paper Level SCI,SCIE
IEEE Format Yoon-Jae Yeo, Yong-Goo Shin, Min-Cheol Sagong, Seung-Wook Kim, Sung-Jea Ko, "Simple Yet Effective Way for Improving the Performance of Lossy Image Compression," IEEE Signal Processing Letters, vol. 27, pp. 530-534, Mar. 2020.
Yoon-Jae Yeo, Yong-Goo Shin, Min-Cheol Sagong, Seun...
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Count IP 222
Paper Level SCI,SCIE
IEEE Format M. Fan, S.-W. Jung, and S.-J. Ko, "Highly Accurate Scale Estimation from Multiple Keyframes using RANSAC Plane Fitting with a Novel Scoring Method," IEEE Trans. Veh. Technol., vol. 69, no. 12, pp. 15335-15345, Dec. 2020.
Ming Fan, Seung-Won Jung, and Sung-Jea Ko, "Highly ...