국제학술지논문(SCI) Robust Remote Gaze Estimation Method Based on Multiple Geometric Transforms

Count IJ181 

Paper Level SCI 

IEEE Format C. Ma, K.-A Choi, B.-D. Choi, and S.-J. Ko, "Robust remote gaze estimation method based on multiple geometric transforms," Opt. Eng., vol. 54, no. 8, pp. 083103-7, Aug. 2015. 

C. Ma, K.-A Choi, B.-D. Choi, and S.-J. Ko, "Robust remote gaze estimation method based on multiple geometric transforms," Opt. Eng., vol. 54, no. 8, pp. 083103-7, Aug. 2015.

국제학술지논문(SCI) A Fast Noise-Robust Interpolation Method Based on Second-Order Directional-Derivatives

Count IJ182 

Paper Level SCI 

IEEE Format S.-J. Lee, J.-H. Kim, S.-J. Kang, W. Choe, and S.-J. Ko, "A fast noise-robust interpolation method based on second-order directional-derivatives," IEEE Trans. Consum. Electron., vol. 61, no. 3, pp. 368-375, Aug. 2015. 

S.-J. Lee, J.-H. Kim, S.-J. Kang, W. Choe, and S.-J. Ko, "A fast noise-robust interpolation method based on second-order directional-derivatives," IEEE Trans. Consum. Electron., vol. 61, no. 3, pp. 368-375, Aug. 2015.

국제학술지논문(SCI) A Fast Noise-Robust Interpolation Method Based on Second-Order Directional-Derivatives

Count IJ182 

Paper Level SCI 

IEEE Format S.-J. Lee, J.-H. Kim, S.-J. Kang, W. Choe, and S.-J. Ko, "A fast noise-robust interpolation method based on second-order directional-derivatives," IEEE Trans. Consum. Electron., vol. 61, no. 3, pp. 368-375, Aug. 2015. 

S.-J. Lee, J.-H. Kim, S.-J. Kang, W. Choe, and S.-J. Ko, "A fast noise-robust interpolation method based on second-order directional-derivatives," IEEE Trans. Consum. Electron., vol. 61, no. 3, pp. 368-375, Aug. 2015.

국제학술지논문(SCI) A Novel Obstacle Detection Method based on Deformable Grid for the Visually Impaired

Count IJ183 

Paper Level SCI 

IEEE Format M.-C. Kang, S.-H. Chae, J.-Y. Sun, J.-W. Yoo, and S.-J. Ko, "A novel obstacle detection method based on deformable grid for the visually impaired," IEEE Trans. Consum. Electron., vol. 61, no. 3, pp. 376-383, Aug. 2015. 

M.-C. Kang, S.-H. Chae, J.-Y. Sun, J.-W. Yoo, and S.-J. Ko, "A novel obstacle detection method based on deformable grid for the visually impaired," IEEE Trans. Consum. Electron., vol. 61, no. 3, pp. 376-383, Aug. 2015.

국제학술지논문(SCI) Retinex-Based Illumination Normalization Using Class-Based Illumination Subspace for Robust Face Recognition

Count IJ184 

Paper Level SCIE 

IEEE Format S.-W. Kim, J.-Y. Jung, C.-H. Yoo, and S.-J. Ko, “Retinex-based illumination normalization using class-based illumination subspace for robust face recognition,” Signal Process., vol. 120, pp. 348-358, Mar. 2016. 

S.-W. Kim, J.-Y. Jung, C.-H. Yoo, and S.-J. Ko, “Retinex-based illumination normalization using class-based illumination subspace for robust face recognition,” Signal Process., vol. 120, pp. 348-358, Mar. 2016.

국제학술지논문(SCI) Retinex-Based Illumination Normalization Using Class-Based Illumination Subspace for Robust Face Recognition

Count IJ184 

Paper Level SCIE 

IEEE Format S.-W. Kim, J.-Y. Jung, C.-H. Yoo, and S.-J. Ko, “Retinex-based illumination normalization using class-based illumination subspace for robust face recognition,” Signal Process., vol. 120, pp. 348-358, Mar. 2016. 

S.-W. Kim, J.-Y. Jung, C.-H. Yoo, and S.-J. Ko, “Retinex-based illumination normalization using class-based illumination subspace for robust face recognition,” Signal Process., vol. 120, pp. 348-358, Mar. 2016.

국제학술지논문(SCI) A Novel Quality Assessment Method for Flat Panel Display Defects

Count IJ185 

Paper Level SCIE 

IEEE Format H. Kim, H. Gu, Y.-H. Kim, K.-A Choi, and S.-J. Ko, “A novel quality assessment method for flat panel display defects,” IEEE J. Display Technol., vol. 12, no. 5, pp. 500-505, May 2016. 

H. Kim, H. Gu, Y.-H. Kim, K.-A Choi, and S.-J. Ko, “A novel quality assessment method for flat panel display defects,” IEEE J. Display Technol., vol. 12, no. 5, pp. 500-505, May 2016.

국제학술지논문(SCI) A Novel Quality Assessment Method for Flat Panel Display Defects

Count IJ185 

Paper Level SCIE 

IEEE Format H. Kim, H. Gu, Y.-H. Kim, K.-A Choi, and S.-J. Ko, “A novel quality assessment method for flat panel display defects,” IEEE J. Display Technol., vol. 12, no. 5, pp. 500-505, May 2016. 

H. Kim, H. Gu, Y.-H. Kim, K.-A Choi, and S.-J. Ko, “A novel quality assessment method for flat panel display defects,” IEEE J. Display Technol., vol. 12, no. 5, pp. 500-505, May 2016.

국제학술지논문(SCI) Vector Radix 2 × 2 Sliding Fast Fourier Transform

Count IJ186 

Paper Level SCIE 

IEEE Format K.-Y. Byun, C.-S. Park, J.-Y. Sun, and S.-J. Ko, “Vector radix 2 × 2 sliding fast Fourier transform,” Math. Probl. Eng., vol. 2016, 2016. 

K.-Y. Byun, C.-S. Park, J.-Y. Sun, and S.-J. Ko, “Vector radix 2 × 2 sliding fast Fourier transform,” Math. Probl. Eng., vol. 2016, 2016.

국제학술지논문(SCI) Vector Radix 2 × 2 Sliding Fast Fourier Transform

Count IJ186 

Paper Level SCIE 

IEEE Format K.-Y. Byun, C.-S. Park, J.-Y. Sun, and S.-J. Ko, “Vector radix 2 × 2 sliding fast Fourier transform,” Math. Probl. Eng., vol. 2016, 2016. 

K.-Y. Byun, C.-S. Park, J.-Y. Sun, and S.-J. Ko, “Vector radix 2 × 2 sliding fast Fourier transform,” Math. Probl. Eng., vol. 2016, 2016.

국제학술지논문(SCI) 2D histogram equalisation based on the human visual system

Count IJ187 

Paper Level SCI 

IEEE Format S.-W. Kim, B.-D. Choi, W.-J. Park, and S.-J. Ko, "2D histogram equalisation based on the human visual system," Electron. Lett., vol. 52, no. 6, pp. 443-445, Mar. 2016. 

S.-W. Kim, B.-D. Choi, W.-J. Park, and S.-J. Ko, "2D histogram equalisation based on the human visual system," Electron. Lett., vol. 52, no. 6, pp. 443-445, Mar. 2016.

국제학술지논문(SCI) 2D histogram equalisation based on the human visual system

Count IJ187 

Paper Level SCI 

IEEE Format S.-W. Kim, B.-D. Choi, W.-J. Park, and S.-J. Ko, "2D histogram equalisation based on the human visual system," Electron. Lett., vol. 52, no. 6, pp. 443-445, Mar. 2016. 

S.-W. Kim, B.-D. Choi, W.-J. Park, and S.-J. Ko, "2D histogram equalisation based on the human visual system," Electron. Lett., vol. 52, no. 6, pp. 443-445, Mar. 2016.

국제학술지논문(SCI) An Edge-Guided Image Interpolation Method Using Taylor Series Approximation

Count IJ188 

Paper Level SCI 

IEEE Format S.-J. Lee, M.-C. Kang, K.-H. Uhm, and S.-J. Ko, "An edge-guided image interpolation method using Taylor series approximation," IEEE Trans. Consum. Electron., vol. 62, no. 2, pp. 159-165, May 2016. 

S.-J. Lee, M.-C. Kang, K.-H. Uhm, and S.-J. Ko, "An edge-guided image interpolation method using Taylor series approximation," IEEE Trans. Consum. Electron., vol. 62, no. 2, pp. 159-165, May 2016.

국제학술지논문(SCI) Iterative Image Dehazing Using the Dark Channel Prior

Count IJ189 

Paper Level SCI 

IEEE Format S.-H. Lee, S.-W. Jung and S.-J. Ko, "Iterative image dehazing using the dark channel prior," IEICE Trans. Fundam. Electron., Commun. Comput. Sci., vol. E99.A, no. 10, pp. 1904-1906, Oct. 2016. 

S.-H. Lee, S.-W. Jung and S.-J. Ko, "Iterative image dehazing using the dark channel prior," IEICE Trans. Fundam. Electron., Commun. Comput. Sci., vol. E99.A, no. 10, pp. 1904-1906, Oct. 2016.

국제학술지논문(SCI) Camera-based Color Calibration Method for Multiple Flat-panel Displays Using Smartphone

Count IJ190 

Paper Level SCIE 

IEEE Format J.-Y. Jung, S.-W. Kim, S. Park, B.-D. Choi, and S.-J. Ko, "Camera-based color calibration method for multiple flat-panel displays using smartphone," IEEE J. Display Technol., vol. 12, no. 12, pp. 1777-1784, Dec. 2016. 

J.-Y. Jung, S.-W. Kim, S. Park, B.-D. Choi, and S.-J. Ko, "Camera-based color calibration method for multiple flat-panel displays using smartphone," IEEE J. Display Technol., vol. 12, no. 12, pp. 1777-1784, Dec. 2016.

국제학술지논문(SCI) Remote eye-gaze tracking method robust to the device rotation

Count IJ191 

Paper Level SCI 

IEEE Format S.-T. Kim, K.-A Choi, Y.-G. Shin, M.-C. Kang, and S.-J. Ko, "Remote eye-gaze tracking method robust to the device rotation," Opt. Eng., vol. 55, no. 8, pp. 083108, Aug. 2016. 

S.-T. Kim, K.-A Choi, Y.-G. Shin, M.-C. Kang, and S.-J. Ko, "Remote eye-gaze tracking method robust to the device rotation," Opt. Eng., vol. 55, no. 8, pp. 083108, Aug. 2016.

국제학술지논문(SCI) Automatic facial pore analysis system using multi-scale pore detection

Count IJ192 

Paper Level SCI 

IEEE Format J.-Y. Sun, S.-W. Kim, S.-H. Lee, J.-E. Choi, and S.-J. Ko, "Automatic facial pore analysis system using multi-scale pore detection," Skin Res. Technol., Nov. 2016. 

J.-Y. Sun, S.-W. Kim, S.-H. Lee, J.-E. Choi, and S.-J. Ko, "Automatic facial pore analysis system using multi-scale pore detection," Skin Res. Technol., Nov. 2016.

국제학술지논문(SCI) Split-and-Merge Based Block Partitioning for High Efficiency Image Coding

Count IJ193 

Paper Level SCI 

IEEE Format B.-D. Choi and S.-J. Ko, "Split-and-merge based block partitioning for high efficiency image coding," IEEE Trans. Circuits Syst. Video Technol., vol. 28, no. 2, pp. 540-549, Oct. 2016. 

B.-D. Choi and S.-J. Ko, "Split-and-merge based block partitioning for high efficiency image coding,"  IEEE Trans. Circuits Syst. Video Technol., vol. 28, no. 2, pp. 540-549, Oct. 2016.

국제학술지논문(SCI) Illumination normalisation using convolutional neural network with application to face recognition

Count IJ194 

Paper Level SCI 

IEEE Format Y.-H. Kim, H. Kim, S.-W. Kim, H.-Y. Kim, and S.-J. Ko, "Illumination normalisation using convolutional neural network with application to face recognition," Electron. Lett., vol. 53, no. 6, pp. 399-401, Mar. 2017. 

Y.-H. Kim, H. Kim, S.-W. Kim, H.-Y. Kim, and S.-J. Ko, "Illumination normalisation using convolutional neural network with application to face recognition," Electron. Lett., vol. 53, no. 6, pp. 399-401, Mar. 2017.

국제학술지논문(SCI) Illumination normalisation using convolutional neural network with application to face recognition

Count IJ194 

Paper Level SCI 

IEEE Format Y.-H. Kim, H. Kim, S.-W. Kim, H.-Y. Kim, and S.-J. Ko, "Illumination normalisation using convolutional neural network with application to face recognition," Electron. Lett., vol. 53, no. 6, pp. 399-401, Mar. 2017. 

Y.-H. Kim, H. Kim, S.-W. Kim, H.-Y. Kim, and S.-J. Ko, "Illumination normalisation using convolutional neural network with application to face recognition," Electron. Lett., vol. 53, no. 6, pp. 399-401, Mar. 2017.